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In Ho Kang

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Degeneration Mechanism of 30 Mev and 100 Mev Proton Irradiation Effects on 1.2 Kv Sic Mosfets

Number of pages: 26 Posted: 09 Jan 2024
Jae Hwa Seo, Young Jo Kim, In Ho Kang, Jeong Hyun Moon, Yu-Mi Kim, Young Jun Yoon and Hyoung Woo Kim
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Korea Atomic Energy Research Institute, Andong National University and affiliation not provided to SSRN
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silicon carbide (SiC), MOSFET, 1.2kV-class, Proton irradiation, Total ionizing dose (TID), Displacement damage (DD)