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Ivo Rangelow

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy

Number of pages: 15 Posted: 16 Jan 2024
Ewelina Gacka, Bartosz C. Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo Rangelow and Teodor P. Gotszalk
Wrocław University of Science and Technology, Wrocław University of Science and Technology, affiliation not provided to SSRN, Wrocław University of Science and Technology, affiliation not provided to SSRN and Wrocław University of Science and Technology
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Abstract:

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SPM, C-AFM, FIBID, Nanowire probes, Postprocessing steps, Usability tests