Qiang Liu

affiliation not provided to SSRN

No Address Available

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Scholarly Papers (1)

1.

Probabilistic Modelling of the Notch Fatigue Under Size Effect Using Micromechanics-Based Critical Distance Theory

Number of pages: 28 Posted: 26 Jan 2024
affiliation not provided to SSRN, University of Electronic Science and Technology of China (UESTC) - School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China (UESTC) - School of Mechanical and Electrical Engineering, Changsha University of Science and Technology, affiliation not provided to SSRN, affiliation not provided to SSRN and Sichuan University - Failure Mechanics and Engineering Disaster Prevention and Mitigation Key Laboratory
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Abstract:

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crystal plasticity, critical distance, probabilistic, notch fatigue, size effect