default author photo

A.O. Chulkov

Tomsk Polytechnic University

Lenin ave., 30

Tomsk, 634050

Ukraine

  • Tomsk Polytechnic University

SCHOLARLY PAPERS

4

DOWNLOADS

131

TOTAL CITATIONS

0

Scholarly Papers (4)

Actions:
Email selected abstracts
1.

Simulated Delaminations in Thermal Ndt Standards and the Concept of Thermally Equivalent Defects

Number of pages: 18 Posted: 30 Apr 2024
Vladimir Vavilov, D.D. Burleigh, A.O. Chulkov and D.Yu. Kladov
Tomsk Polytechnic University, affiliation not provided to SSRN, Tomsk Polytechnic University and Tomsk Polytechnic University
Downloads 54 (1,031,043)

Abstract:

Loading...

thermal nondestructive testing, TNDT, composite, defect, reference sample, modeling, delamination, probability of detection

2.

Noise Suppression in IR Thermographic Ndt Efficiency of Data Processing Algorithms

Number of pages: 22 Posted: 08 Feb 2024
Vladimir Vavilov, A.O. Chulkov, Vladimir Shiryaev, Marina Kuimova and Hai Zhang
Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University and Harbin Institute of Technology
Downloads 38 (1,209,354)

Abstract:

Loading...

infrared thermography, nondestructive testing, noise, data processing, modeling

3.

The methodology of defect thermal characterization in pulsed thermal NDT based on 3D numerical solutions and polynomial approximation

Number of pages: 16 Posted: 02 Sep 2025
Vladimir Vavilov, A.O. Chulkov, Olesia Ganina, Marina Kuimova and Oleg Makushev
Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University and Tomsk Polytechnic University
Downloads 29 (1,332,057)

Abstract:

Loading...

thermal nondestructive testing, defect characterization, numerical modeling, polynomial approximation, reference standards

4.

HIGH-PRODUCTIVE THERMAL NDT OF PHARMACEUTICAL PLASTIC CONTAINER PACKAGING

Number of pages: 17 Posted: 23 Oct 2025
A.O. Chulkov, Vladimir Vavilov, Oleg Makushev, Viktor Stasevskii, Vladimir Shiryaev and Alexander Avstrievskikh
Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University, Tomsk Polytechnic University and Tomsk Polytechnic University
Downloads 10 (1,541,665)

Abstract:

Loading...

thermal nondestructive testing, food product packaging, product label, shrink film, delamination, defect, packaging geometry