Van Dong Pham

affiliation not provided to SSRN

No Address Available

  • affiliation not provided to SSRN

SCHOLARLY PAPERS

1

DOWNLOADS

30

TOTAL CITATIONS

0

Scholarly Papers (1)

Actions:
Email selected abstracts
1.

Atomic-Scale Characterization of Defects in Oxygen Plasma-Treated Graphene by Scanning Tunneling Microscopy

Number of pages: 23 Posted: 11 Mar 2024
Van Dong Pham, César González, Yannick J. Dappe, Chengye Dong, Joshua Robinson, Achim Trampert and Roman Engel-Herbert
affiliation not provided to SSRN, affiliation not provided to SSRN, University of the Basque Country - Department of Condensed Matter Physics, affiliation not provided to SSRN, Pennsylvania State University - 2D Crystal Consortium Material Innovation Platform (2DCC-MPI) Materials Research Institute, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 30 (1,039,380)

Abstract:

Loading...

defect, epitaxial graphene, SiC, scanning tunneling microscopy/spectroscopy, density functional theory