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Sylvain Duprey

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Scholarly Papers (1)

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Optical Constants and Thickness Determination of La2/3sr1/3mno3 Thin Films on Nb:Srtio3 Substrates by Spectro-Ellipsometry: Combination of Optical and X-Ray Techniques

Number of pages: 15 Posted: 01 Apr 2024
Jérémy Blond, Christian Dufour, Sandeep Kumar Chaluvadi, Sylvain Duprey, Xavier Portier, Philippe Marie, Victor Pierron, Laurence Méchin and Bruno Guillet
affiliation not provided to SSRN, affiliation not provided to SSRN, Total Administrative Services Corporation (TASC) - Istituto Officina dei Materiali, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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Oxide heterostructure, Spectro-ellipsometry, Spectrophotometry, X-ray characterization, Cross-analysis