default author photo

Jong-Heon Yang

Electronics and Telecommunications Research Institute

218 Gajeong-ro, Yuseong-gu

Daejeon, 305-700

Korea, Republic of (South Korea)

SCHOLARLY PAPERS

2

DOWNLOADS

115

TOTAL CITATIONS

0

Scholarly Papers (2)

1.

Long-Term Stable and High-Performance Indium–Tungsten Oxide Thin Film Transistors for Transparent Electronics

Number of pages: 14 Posted: 22 May 2025
Kwangwoon University, Kwangwoon University, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute and Kwangwoon University
Downloads 65 (961,006)

Abstract:

Loading...

Indium-tungsten oxide, Thin-film transistor, Channel material, Threshold voltage instability, Long-term reliability

2.

Process Design for Improvement in Device Performance of Top-Gate Tfts Using In-Sn-Zn-O Channels Prepared by Thermal Atomic-Layer Deposition

Number of pages: 39 Posted: 16 Oct 2024
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute and affiliation not provided to SSRN
Downloads 50 (1,097,529)

Abstract:

Loading...

thin-film transistor (TFT), In-Sn-Zn-O (ITZO), atomic-layer deposition (ALD), amorphous oxide semiconductor, top-gate structure