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Zonglin Lv

University of Science and Technology Beijing

30 Xueyuan Road, Haidian District

beijing, 100083

China

  • University of Science and Technology Beijing

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Scholarly Papers (1)

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Emergence of Critical Thickness and Multifaceted Role of Stacking Faults in High Misfit Hexagonal Ferrites Films

Number of pages: 23 Posted: 01 May 2024
Xiangfei Li, Zonglin Lv, Ying Meng, Luyao Wang, Haoyu Zhuang, Qinwen Guo, Xiaohui Yu, Xi Shen, Jun Miao and Richeng Yu
Chinese Academy of Sciences (CAS), University of Science and Technology Beijing, Chinese Academy of Sciences (CAS), Chinese Academy of Sciences (CAS), Chinese Academy of Sciences (CAS), Chinese Academy of Sciences (CAS), Chinese Academy of Sciences (CAS), Chinese Academy of Sciences (CAS), University of Science and Technology Beijing - Beijing Advanced Innovation Center for Materials Genome Engineering and Chinese Academy of Sciences (CAS)
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Abstract:

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improper ferroelectric materials, critical thickness, oxygen vacancy, stacking fault