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Fahmida Nasrin

affiliation not provided to SSRN

SCHOLARLY PAPERS

1

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0

Scholarly Papers (1)

1.

Length-Based Quantitative Characterization of Metallic and Semiconducting Single-Wall Carbon Nanotubes Using Electrostatic Force Microscopy

Number of pages: 24 Posted: 15 May 2024
Shizuoka University, affiliation not provided to SSRN, affiliation not provided to SSRN, NEC Corporation and affiliation not provided to SSRN
Downloads 20 (1,448,301)

Abstract:

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single-wall carbon nanotubes, electrostatic forc microscopy (EFM), weighted statistics, semiconducting purity, quantitative analysis