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Jinyong Jeong

Korea University

1 Anam-dong 5 ka

Seoul, 136-701

Korea, Republic of (South Korea)

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Class-Imbalanced Semi-Supervised Learning with Exponential Threshold Smoothing for Wafer Bin Map Defect Pattern Classification

Number of pages: 24 Posted: 14 Jun 2024
Jinyong Jeong, Hyungu Kahng and Seoung Bum Kim
Korea University, Korea University - School of Industrial Management Engineering and Korea University - School of Industrial Management Engineering
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Abstract:

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Wafer bin map defect pattern classification, semiconductor manufacturing, semi-supervised learning, class-imbalanced learning, class-imbalanced semi-supervised learning