computational geometry, geometric deep learning, Control cabinet, Worker assistance, Assembly automation, Positioning accuracy
Blackboard Pattern, Large Language Models, Anomaly Handling, Industrial Systems, Knowledge Integration, Multi-Agent Systems, Continuous Learn-ing, Manufacturing Systems
Raman spectroscopy, Surface Enhanced Raman Scattering (SERS), Gas Chromatography-Mass Spectrometry (GC-MS), SERS Substrate Enhancement Factor (SSEF)