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Ming Han

Michigan State University

Agriculture Hall

East Lansing, MI 48824-1122

United States

  • Michigan State University

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Scholarly Papers (1)

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A Novel Multi-Fidelity Gaussian Process Regression Approach for Defect Characterization in Motion-Induced Eddy Current Testing

Number of pages: 19 Posted: 01 Jul 2024
XUHUI HUANG, Zi Li, Lei Peng, Yufei Chu, Zebadiah Miles, Sunil Kishore Chakrapani, Ming Han, Dr. Anish Poudel and Yiming Deng
Michigan State University, Michigan State University, Michigan State University, Michigan State University, Michigan State University, Michigan State University, Michigan State University, MxV Rail and Michigan State University
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Abstract:

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Motion induced eddy current testing, Magnetic flux leakage, Surrogate modeling, Inverse Problem