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Alessandra Rachetti
Montanuniversität Leoben
Leoben
Austria
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Montanuniversität Leoben
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SCHOLARLY PAPERS
1
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Scholarly Papers (1)
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1.
Evaluation of X-Ray Fluorescence for Analysing Critical Elements in Three Electronic Waste Matrices: A Comprehensive Comparison of Analytical Techniques
Number of pages: 37
Posted: 22 Jul 2024
Shaun T. Lancaster
,
Eskil Sahlin
,
Marcus Oelze
,
Markus Ostermann
,
Jochen Vogl
,
Valérie Laperche
,
Solène Touzé
,
Jean-Philippe Ghestem
,
Claire Dalencourt
,
Régine Gendre
,
Jessica Stammeier
,
Ole Klein
,
Daniel Pröfrock
,
Gala Košarac
,
Aida Jotanovic
,
Luigi Bergamaschi
,
Marco Di Luzio
,
Giancarlo D'Agostino
,
Radojko Jaćimović
,
Melissa Eberhard
,
Laura Feiner
,
Simone Trimmel
, Alessandra Rachetti,
Timo Sara-Aho
,
Anita Roethke
,
Lena Michaliszyn
,
Axel Pramann
,
Olaf Rienitz
and
Johanna Irrgeher
Montanuniversität Leoben,
affiliation not provided to SSRN
,
affiliation not provided to SSRN
, Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing,
affiliation not provided to SSRN
,
affiliation not provided to SSRN
, Bureau de Recherches Géologiques et Minières (BRGM),
affiliation not provided to SSRN
,
affiliation not provided to SSRN
,
affiliation not provided to SSRN
,
affiliation not provided to SSRN
, Helmholtz-Zentrum Hereon - Department for Inorganic Environmental Chemistry, Helmholtz-Zentrum Hereon - Department for Inorganic Environmental Chemistry,
affiliation not provided to SSRN
,
affiliation not provided to SSRN
, National Institute of Metrological Research, National Institute of Metrological Research, National Institute of Metrological Research, Jožef Stefan Institute, Montanuniversität Leoben,
affiliation not provided to SSRN
, Montanuniversität Leoben, Montanuniversität Leoben, Government of the Republic of Finland - Finnish Environment Institute, Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt, Physikalisch-Technische Bundesanstalt and Montanuniversität Leoben
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Abstract:
XRF, WEEE, PCB, Battery, LED, recycling
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