Fengyi Chen

Shenzhen University

3688 Nanhai Road, Nanshan District

Shenzhen, 518060

China

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A Non-Destructive Testing System for Battery Defects Based on Ultrasonic Guided Wave Imaging

Number of pages: 31 Posted: 14 Aug 2024

Di Zhou, Fengyi Chen, Jinlian Liang, Yanhui Zhang, Wenbin Zheng and Xiaoyu Li

affiliation not provided to SSRN, Shenzhen University, Harbin University of Science and Technology, affiliation not provided to SSRN, Harbin Institute of Technology and Shenzhen University

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