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Antonio Massimiliano Mio

affiliation not provided to SSRN

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Evolution of the Liquid/Solid Interface Roughness in Si1-Xgex Layers Processed by Nanosecond Laser Annealing

Number of pages: 29 Posted: 20 Sep 2024
Rémi DEMOULIN, Richard Daubriac, Sébastien Kerdilès, Lea Dagault, Obaid Adami, Damiano Ricciarelli, Jean-Michel Hartmann, Francesca Chiodi, Antonio Massimiliano Mio, Mathieu Opprecht, Emmanuel Scheid, Pablo Acosta-Alba, Dominique Débarre, Antonino La Magna and Fuccio Cristiano
Université et INSA de Rouen - Groupe de Physique des Matériaux, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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pulsed laser annealing, silicon-germanium, strain, liquid-solid interface, roughness