Du Heon Ha

Chung-Ang University

221 Heuksuk-dong

Dongjak-gu

Seoul, 156-756

Korea, Republic of (South Korea)

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Suppression Strategy of Interfacial Defects: Γ-Ray-Induced Nano Structural Rearrangement of Niox Sol-Gel for Highly Sensitive Organic Photodetectors

Number of pages: 40 Posted: 19 Oct 2024

Byung Gi Kim, Ji Yun Chun, Jae Sang Cho, Du Heon Ha and Dong Hwan Wang

Chung-Ang University, Chung-Ang University, Chung-Ang University, Chung-Ang University and Chung-Ang University

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