default author photo

Vincent Gauthier

CY Cergy Paris Université

paris

France

SCHOLARLY PAPERS

1

DOWNLOADS

38

TOTAL CITATIONS

0

Scholarly Papers (1)

1.

Critical Micelle Concentration Determination with Non-Contact Rf Dielectric Impedancemetry for Surfactants in Solution

Number of pages: 19 Posted: 15 Apr 2025
CY Cergy Paris Université, CY Cergy Paris Université, CY Cergy Paris Université and CY Cergy Paris Université
Downloads 38 (1,222,651)

Abstract:

Loading...

CMC, surfactant, Dielectric properties, radiofrequency impedancemetry