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Hsun-Yun Chang

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Nondestructive Analysis of Al2o3/Siox/Si Passivation Layers for Photovoltaics Using Angle-Resolved Xps and Haxpes Techniques

Number of pages: 17 Posted: 17 May 2025
I-Chia Huang, Pei-Chen Huang, Hsun-Yun Chang, Ting-Jia Yang, Chia-Chien Kuo, Man-Ying Wang, Jing-Jong Shyue and Wei-Chun Lin
Academia Sinica, National Sun Yat-sen University, affiliation not provided to SSRN, National Sun Yat-sen University, National Sun Yat-sen University, National Sun Yat-sen University, Academia Sinica - Research Center for Applied Sciences and National Sun Yat-sen University
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Al2O3 passivation layer, AR-XPS, HAXPES, Non-destructive Depth Profiling, XPS