Haihe Zhao

Northeastern University (USA)

220 B RP

Boston, MA 02115

United States

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Detection of Mechanical Stress-Induced Micro Short Circuits in Lithium-Ion Batteries Utilizing Hellinger Distance and Inverse Markov Method

Number of pages: 27 Posted: 27 May 2025

Hong Liang, Renjing Gao, zeyu chen, Guoqiang Han and Haihe Zhao

Dalian University of Technology, Dalian University of Technology, Northeastern University (USA), Northeastern University (USA) and Northeastern University (USA)

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