27 Shanda Nanlu
South Rd.
Jinan, SD 250100
China
Shandong University
4H-SiC, Extrinsic Frank Stacking Fault, Temperature Field, Polytype inclusions, X-ray Topography, Photoluminescence
p-type 4H-SiC, Raman scattering, Fano interference, photoluminescence