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Wenkai Tan

affiliation not provided to SSRN

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Anomaly Detection for Antenna-Based Defect Detection in Additive Manufacturing: A Grounded, Instructible, and Aligned Learning Framework

Number of pages: 22 Posted: 02 Aug 2025
Wenkai Tan, Jayaprakash B. Shivakumar, Rishikesh Srinivasaraghavan, Nicholas Reed, Yongxin Liu, Eduardo Rojas, Daewon Kim and Houbing Herbert Song
affiliation not provided to SSRN, affiliation not provided to SSRN, Embry-Riddle Aeronautical University, Embry-Riddle Aeronautical University, Embry-Riddle Aeronautical University, Embry-Riddle Aeronautical University, Embry-Riddle Aeronautical University and University of Maryland, College Park
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Anomaly Detection, AI Grounding, Additive manufacturing, Zero-bias Deep Neural Network