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James Jun Yuan Tan

affiliation not provided to SSRN

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A Position-Independent Dual-Focal-Spot Terahertz Spectroscopic Method for Accurate Thickness Characterization of Multilayer Coatings on Anisotropic Substrates

Number of pages: 14 Posted: 06 Aug 2025
Qing Yang Steve Wu, Lei Zhang, Andrew Chun Yong Ngo, Lin Ke, James Jun Yuan Tan and Sam Pak Sum Li
Agency for Science, Technology and Research (A*STAR) - Institute of Materials Research and Engineering, Agency for Science, Technology and Research (A*STAR) - Institute of Materials Research and Engineering, Agency for Science, Technology and Research (A*STAR) - Institute of Materials Research and Engineering, Agency for Science, Technology and Research (A*STAR) - Institute of Materials Research and Engineering, affiliation not provided to SSRN and affiliation not provided to SSRN
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Abstract:

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Terahertz spectroscopy, multilayer coatings, anisotropic substrates, CFRP, inverse modeling, particle swarm optimization, coating thickness measurement