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Avazbek Tolibjon ugli Dekhkonov

affiliation not provided to SSRN

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Scholarly Papers (1)

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Investigation of Electrical Conductivity and Thermopower in Thick Film Resistors Caused by Ruthenium Diffusion into Silicate Glass

Number of pages: 15 Posted: 19 Aug 2025
Avazbek Tolibjon ugli Dekhkonov, G. Abdurakhmanov and Mukhriddin Egamqul ugli Tursunov
affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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Abstract:

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Keywords: beveled sample, diffusion layer, diffusion coefficient, resistance distribution, diffusion profile, thermopower, diffusion zone