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Andrey Kaveev

affiliation not provided to SSRN

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Scholarly Papers (1)

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Structural and mechanical properties of the growth interface between epitaxial III-V nanowires and Si substrate studied by atomic force microscopy

Number of pages: 6 Posted: 30 Aug 2025
Ioffe Institute, affiliation not provided to SSRN, Peter the Great Saint Petersburg Polytechnic University, affiliation not provided to SSRN and Peter the Great Saint Petersburg Polytechnic University
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Abstract:

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nanowire, GaP, InAs, interface, epitaxy, atomic force microscopy