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Yuxian Xiao

South China Normal University

483 Wushan Str.

Tianhe District

Guangzhou, 510631, 510642

China

SCHOLARLY PAPERS

1

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38

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0

Scholarly Papers (1)

1.

Fluorosilane-bridged High-reliability Dielectric Interfaces for Electrowetting Application

Number of pages: 26 Posted: 15 Sep 2025
South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University, South China Normal University and South China Normal University - SCNU-TUE Joint Lab of Device Integrated Responsive Materials (DIRM)
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Abstract:

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Electrowetting, Anticorrosion interfaces, Fluorosilane coupling, Dielectric barrier, Leakage current, Engineering application