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Wei Han

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Photoluminescence-based dopant imaging of Ga-, P- and Sb-doped Czochralski-Grown Silicon Wafers for Solar Cells

Number of pages: 13 Posted: 07 Jan 2026
Afsaneh kashizadeh, Rabin Basnet, Khoa Nguyen, Stephane Armand, Chris Samundsett, Wei Han, Yichun Wang, AnYao Liu and Daniel Macdonald
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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Abstract:

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Recharged Czochralski silicon, dopant distribution, photoluminescence imaging, resistivity calibration, segregation coefficient, melt convection