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Shoudeng Wang

affiliation not provided to SSRN

SCHOLARLY PAPERS

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Scholarly Papers (1)

1.

Deciphering Degradation in Porous Transport Layer-based HO- PEMFCs: Insights from 6600-Cycle Operando Durability Tests

Number of pages: 23 Posted: 13 Jan 2026
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Shanghai Jiao Tong University (SJTU) - Shanghai Key Laboratory of Digital Manufacture for Thin-walled Structures, Shanghai Jiao Tong University (SJTU) - Shanghai Key Laboratory of Digital Manufacture for Thin-walled Structures and Shanghai Jiao Tong University (SJTU) - Shanghai Key Laboratory of Digital Manufacture for Thin-walled Structures
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Abstract:

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HO-PEMFCs, porous transport layer, 6, 600-cycle operando durability test, degradation mechanisms, membrane electrode assembly