Robustness of Various Production Control Policies in Semiconductor Manufacturing

Productions and Operations Management, Vol. 9, No. 2, pp. 171-183, Summer 2000

13 Pages Posted: 12 Feb 2008

See all articles by Houmin Yan

Houmin Yan

The Chinese University of Hong Kong (CUHK) - Department of Systems Engineering & Engineering Management

Sheldon Lou

Independent

Suresh Sethi

University of Texas at Dallas - Naveen Jindal School of Management

Abstract

This paper compares several different production control policies in terms of their robustness to random disturbances such as machine failures, demand fluctuations, and system parameter changes. Simulation models based on VLSI wafer fabrication facilities are utilized to test the performance of the policies. Three different criteria, namely, the average total WIP, the average backlog, and a cost function combining these measures, are used to evaluate performance. Among the policies tested, the Two-Boundary Control policy outperforms the others.

Keywords: Simulation, Kanban, Two-Boundary Control, Push and Pull Production Policies, Re-Entrant Shop, Semiconductor Manufacturing, Robust Policies, Two-Boundry Control Policies, WIP, Wafer Fabrication

JEL Classification: C61,M11

Suggested Citation

Yan, Houmin and Lou, Sheldon and Sethi, Suresh, Robustness of Various Production Control Policies in Semiconductor Manufacturing. Productions and Operations Management, Vol. 9, No. 2, pp. 171-183, Summer 2000. Available at SSRN: https://ssrn.com/abstract=1092214

Houmin Yan

The Chinese University of Hong Kong (CUHK) - Department of Systems Engineering & Engineering Management ( email )

Shatin, New Territories
Hong Kong

Sheldon Lou

Independent ( email )

No Address Available

Suresh Sethi (Contact Author)

University of Texas at Dallas - Naveen Jindal School of Management ( email )

800 W. Campbell Road, SM30
Richardson, TX 75080-3021
United States

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