Characteristics of Patent Litigation: A Window on Competition

Posted: 5 Jan 2001

See all articles by Jean O. Lanjouw

Jean O. Lanjouw

University of California, Berkeley, College of Natural Resources, Department of Agricultural & Resource Economics (Deceased); Yale University, Faculty of Arts & Sciences, Department of Economics (Deceased); Brookings Institution (Deceased)

Mark A. Schankerman

London School of Economics and Political Science; Centre for Economic Policy Research (CEPR)

Abstract

The cost of engaging in litigation over intellectual property assets diminishes their value as an incentive to invest in research. The frequency of court cases reflects firms' strategies for appropriating innovation rents. We examine the characteristics of litigated patents and their owners by combining, for the first time, information about patent case filings from the U.S. district courts with detailed data from the U.S. Patent and Trademark Office. By comparing filed cases to a control group, we show that there is substantial variation across patents in their exposure to litigation risk. We use this empirical evidence to examine hypotheses about the determinants of patent suits.

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Suggested Citation

Lanjouw, Jean Olson and Schankerman, Mark A., Characteristics of Patent Litigation: A Window on Competition. Available at SSRN: https://ssrn.com/abstract=252299

Jean Olson Lanjouw (Contact Author)

University of California, Berkeley, College of Natural Resources, Department of Agricultural & Resource Economics (Deceased)

Yale University, Faculty of Arts & Sciences, Department of Economics (Deceased) ( email )

28 Hillhouse Ave
New Haven, CT 06520-8264
United States
203-432-3568 (Phone)
203-432-6323 (Fax)

Brookings Institution (Deceased)

Mark A. Schankerman

London School of Economics and Political Science ( email )

Houghton Street
London WC2A 2AE
United Kingdom
+44 20 7955 7518 (Phone)
+44 20 7831 1840 (Fax)

Centre for Economic Policy Research (CEPR) ( email )

London
United Kingdom

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