Faults Detection in Active Analog Bandpass Filter Using OBIST Method

6 Pages Posted: 29 Mar 2019

See all articles by Manisha Singh

Manisha Singh

University of Mumbai - Pillai College of Engineering

Rajendrakumar Khade

University of Mumbai - Pillai College of Engineering

Date Written: December 24, 2018

Abstract

The main objective of this paper is to explain the principal of different analog circuit testing methods to examine the difficulties present in the analog circuit testing i.e. to test the analog parts in a mixed signal circuit. In this paper all possible catastrophic and parametric faults present in the analog bandpass filter are tested by OBIST method which does not requires test vector generator which reduces the test development. Bandpass filter is examined for all possible fault detection and verifying that OBIST approach can improve the overall percentage of fault detection.

Keywords: System-on-Chip (SOC), Oscillation Based In-Built Self Test (OBIST), Circuit Under Test (CUT)

Suggested Citation

Singh, Manisha and Khade, Rajendrakumar, Faults Detection in Active Analog Bandpass Filter Using OBIST Method (December 24, 2018). Proceedings 2019: Conference on Technologies for Future Cities (CTFC), Available at SSRN: https://ssrn.com/abstract=3349630 or http://dx.doi.org/10.2139/ssrn.3349630

Manisha Singh (Contact Author)

University of Mumbai - Pillai College of Engineering ( email )

Dr. K. M.Vasudevan Pillai Campus
Plot 10, Sector 16, New Panvel
Navi Mumbai, 410206
India

Rajendrakumar Khade

University of Mumbai - Pillai College of Engineering ( email )

Dr. K. M.Vasudevan Pillai Campus
Plot 10, Sector 16, New Panvel
Navi Mumbai, 410206
India

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