Faults Detection in Active Analog Bandpass Filter Using OBIST Method
6 Pages Posted: 29 Mar 2019
Date Written: December 24, 2018
The main objective of this paper is to explain the principal of different analog circuit testing methods to examine the difficulties present in the analog circuit testing i.e. to test the analog parts in a mixed signal circuit. In this paper all possible catastrophic and parametric faults present in the analog bandpass filter are tested by OBIST method which does not requires test vector generator which reduces the test development. Bandpass filter is examined for all possible fault detection and verifying that OBIST approach can improve the overall percentage of fault detection.
Keywords: System-on-Chip (SOC), Oscillation Based In-Built Self Test (OBIST), Circuit Under Test (CUT)
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