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Atomic Origins of Radiation-Induced Defects and Interfacial Strengthening in Additively Manufactured Titanium Aluminide Alloy Irradiated with Kr-Ions at Elevated Temperature

36 Pages Posted: 4 Apr 2019 First Look: Under Review

See all articles by Hanliang Zhu

Hanliang Zhu

Government of the Commonwealth of Australia - Australian Nuclear Science and Technology Organisation

Mengjun Qin

Australian Government - Australian Nuclear Science & Technology Organisation

Robert Aughterson

Australian Government - Australian Nuclear Science & Technology Organisation

Tao Wei

Australian Government - Australian Nuclear Science & Technology Organisation

Gregory Lumpkin

Australian Government - Australian Nuclear Science & Technology Organisation

Yan Ma

University of Wollongong - School of Mechanical, Materials, and Mechatronic Engineering

Huijun Li

University of Wollongong - School of Mechanical, Materials, and Mechatronic Engineering

Abstract

The irradiation microstructure of the additively manufactured titanium aluminide (TiAl) alloy subjected to in situ transmission electron microscope (TEM) irradiation with 1 MeV Kr ions at the elevated temperature of 873K was investigated. Triangle and large hexagon shaped volume defects were observed within the γ-TiAl phase in the TEM images of the irradiated microstructure. High resolution TEM images and composition analyses revealed the volume defects were vacancy-type stacking fault tetrahedrals (SFTs). Molecular dynamic simulations showed that the increased diffusion coefficient at the elevated temperature promoted the movement and aggregation of vacancies, leading to the formation and growth of SFTs in the irradiated FCC γ phase. The lamellar interfaces in the irradiation microstructure were more effective for acting as strong sinks to absorb the primary point defects and defect clusters at the elevated temperature. The initial defects at the interfaces of the additively manufactured TiAl alloy enhanced the sink strength of the material and greatly refined SFTs near the lamellar interfaces.

Keywords: TiAl, Additive Manufacturing, High Temperature Irradiation, Radiation-Induced Defects, TEM, TEM Iamge Simulation, Molecular Dynamic Simulation

Suggested Citation

Zhu, Hanliang and Qin, Mengjun and Aughterson, Robert and Wei, Tao and Lumpkin, Gregory and Ma, Yan and Li, Huijun, Atomic Origins of Radiation-Induced Defects and Interfacial Strengthening in Additively Manufactured Titanium Aluminide Alloy Irradiated with Kr-Ions at Elevated Temperature (April 3, 2019). Available at SSRN: https://ssrn.com/abstract=3365146

Hanliang Zhu (Contact Author)

Government of the Commonwealth of Australia - Australian Nuclear Science and Technology Organisation ( email )

Locked Bag 2001
Kirrawee DC
Sydney, NSW 2232
Australia

Mengjun Qin

Australian Government - Australian Nuclear Science & Technology Organisation

United States

Robert Aughterson

Australian Government - Australian Nuclear Science & Technology Organisation

United States

Tao Wei

Australian Government - Australian Nuclear Science & Technology Organisation

United States

Gregory Lumpkin

Australian Government - Australian Nuclear Science & Technology Organisation

United States

Yan Ma

University of Wollongong - School of Mechanical, Materials, and Mechatronic Engineering

Wollongong, NSW2522
Australia

Huijun Li

University of Wollongong - School of Mechanical, Materials, and Mechatronic Engineering

Wollongong, NSW2522
Australia

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