Estimating Yield Gaps with Limited Data: An Application to United States Wheat

14 Pages Posted: 15 Apr 2020

See all articles by Jesse Tack

Jesse Tack

Kansas State University

Andrew Barkley

Kansas State University

Lawton Lanier Nalley

University of Arkansas

Date Written: October 2015

Abstract

The objective of this research is to estimate and analyze the gap between in‐trial yield potential, on‐farm yield potential, and actual on‐farm wheat yields. Yield gaps are quantified by measuring how varietal mean yields have changed over time, due to productivity increases generated by public and private wheat breeding programs. Variety performance trial data for Kansas winter wheat are used to summarize the evolution of wheat yields over the time period 1985 to 2011. A measure of yield potential is compared to actual on‐farm yields to derive implications for wheat industry stakeholders. Persistent and expanding yield gaps between potential yield and actual on‐farm yield are measured and analyzed. Producers’ variety adoption decisions explain a relatively small portion of this gap, and producers have become more effective at identifying and adopting yield‐enhancing varieties over time. The largest portion of these gaps was explained by on‐farm production decisions.

Keywords: breeding, climate, weather, wheat, yield, yield gaps

Suggested Citation

Tack, Jesse and Barkley, Andrew and Lanier Nalley, Lawton, Estimating Yield Gaps with Limited Data: An Application to United States Wheat (October 2015). American Journal of Agricultural Economics, Vol. 97, Issue 5, pp. 1464-1477, 2015, Available at SSRN: https://ssrn.com/abstract=3574903 or http://dx.doi.org/10.1093/ajae/aau157

Jesse Tack (Contact Author)

Kansas State University ( email )

Manhatten, KS 66506-4001
United States

Andrew Barkley

Kansas State University

Lawton Lanier Nalley

University of Arkansas

Fayetteville, AR 72701
United States

Do you have a job opening that you would like to promote on SSRN?

Paper statistics

Downloads
0
Abstract Views
81
PlumX Metrics