Impacts of Single Nitrogen Atoms and Vacancies on the Formation of Nitrogen-Vacancy Defects in Diamond

30 Pages Posted: 13 Oct 2022

See all articles by Chun-Xiang Li

Chun-Xiang Li

Dalian University of Technology

Qingyu Zhang

Dalian University of Technology

Nan Zhou

Dalian University of Technology

Chao Zhang

affiliation not provided to SSRN

Zhong Yi

affiliation not provided to SSRN

Abstract

Using the diamond samples with different N concentrations and irradiated by 10 MeV electron beam with the doses varied from 2.5 × 1017 to 1.0 × 1019 cm−2, the formation of negatively- and neutrally-charged nitrogen-vacancy (NV− and NV0) defects is explored by quantitatively characterizing the concentration of NV defects with the absorption coefficient of NV− at the zero phonon line (ZPL). It is found that NV− centers are predominant in the samples with high N concentrations and irradiated by electron beam with low doses. With the increase in the irradiation dose, NV− concentration is almost linearly increased and NV0 starts to appear in the diamond samples. For the samples with low N and sufficient vacancies, NV0 centers will become predominant and the NV− concentration is relatively low. In the formation of NV defects, excessive N and vacancy seem to act as the roles of donor and acceptor, respectively, and thus dominate the formation of NV− and NV0 centers. In addition to NV− and NV0 centers, other irradiation defects are observed to be luminescent and in association with N and vacancy concentrations. The ZPL490 defects are usually brighter than others in the samples with high N concentrations, while the ZPL503 and ZPL467 defects are often observed in the samples with low N and irradiated by electron beam with relatively high doses.

Keywords: diamond, NV defects, formation, absorption and emission

Suggested Citation

Li, Chun-Xiang and Zhang, Qingyu and Zhou, Nan and Zhang, Chao and Yi, Zhong, Impacts of Single Nitrogen Atoms and Vacancies on the Formation of Nitrogen-Vacancy Defects in Diamond. Available at SSRN: https://ssrn.com/abstract=4246428 or http://dx.doi.org/10.2139/ssrn.4246428

Chun-Xiang Li

Dalian University of Technology ( email )

Huiying Rd
DaLian, LiaoNing, 116024
China

Qingyu Zhang (Contact Author)

Dalian University of Technology ( email )

Huiying Rd
DaLian, LiaoNing, 116024
China

Nan Zhou

Dalian University of Technology ( email )

Huiying Rd
DaLian, LiaoNing, 116024
China

Chao Zhang

affiliation not provided to SSRN ( email )

No Address Available

Zhong Yi

affiliation not provided to SSRN ( email )

No Address Available

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