Inspection of Improved Ghost Imaging for Hight-Light Led with Different Factory Quality

Abstract

We propose a new method for nonlinear feature extraction and inspection of visual weak signals from highlight-emitting rather than "interference" bright objects. Based on the ghost image principle, the highlight characteristics of the light source become a useful characteristic. Optimized design of ghost lens group, visual inspection of bright objects for the purpose of obtaining ghost images with high signal-to-noise ratio. We improved the high-brightness LED appearance quality inspection experiment of ghost image. Results show that the inspection method of improved ghost image of highlighted objects combined with deep learning has a good detection result. There is great potential for visual inspection of objects with high brightness or high reflective properties.

Keywords: Highlight project, Weak signal, Ghost image, Lens group, LED