Improved Microwave Dielectric Properties of Novel Low-Firing Al 2- X Nd X Mo 3 O 12 Ceramics

Abstract

In this study, Al2-xNdxMo3O12 (x = 0.01~0.08) ceramics were fabricated, where the structural configuration and dielectric properties were discussed. In the solid solution range (0.01 ≤ x ≤ 0.06), a monoclinic structure was confirmed via X-ray diffraction, Raman scatting spectroscopy, and TEM analysis. It is revealed that the dielectric constant is dependent on the variations of bulk density and dielectric polarizability, while the dielectric loss is sensitive to the intrinsic packing fraction and external growth of grain. Typically, Al1.99Nd0.01Mo3O12 ceramic with excellent microwave dielectric properties of an εr value ~ 5.63, a Q×f value of about 53624 GHz (14.54 GHz) was achieved when sintered at 825 oC, showing potential for the application of low-temperature co-fired ceramics technology.

Keywords: Electroceramics, Crystal structure, Dielectrics