Microstructure Evolution and Fatigue Properties of Cp-Ti Induced by Cryogenic Low Cycle Fatigue

42 Pages Posted: 23 Sep 2024

See all articles by Ji Seob An

Ji Seob An

affiliation not provided to SSRN

Min Ji Jo

affiliation not provided to SSRN

A. Ra Jo

affiliation not provided to SSRN

Myeong Sik Jeong

affiliation not provided to SSRN

Dong-Kyu Kim

Konkuk University

Young Hoon Moon

Pusan National University

Sun Kwang Hwang

affiliation not provided to SSRN

Abstract

Mechanical twinning plays a crucial role in the plastic deformation of titanium, particularly under cryogenic conditions. The activation of mechanical twinning enhances both the strength and ductility of titanium at these low temperatures. In this study, we investigated the twinning and detwinning behavior of commercially pure titanium (CP-Ti) under cryogenic low cycle fatigue (LCF) loading, comparing the results to those obtained at room temperature (RT). Strain-controlled LCF tests were performed with a strain amplitude of ±2.0%. Ex-situ electron backscatter diffraction analysis revealed a significant increase in twin fraction in specimens subjected to cryogenic temperatures (CT) compared to those tested at RT. Additionally, it was observed that the twinning fraction increased during the early stages of fatigue, with most detwinning occurring during the reverse loading phase of the cycle. Following LCF tests at CT, we observed microstructural evolution, including an increase in residual twinning, associated dislocation density, and grain refinement. The improvement in mechanical properties, such as fatigue stress and fatigue life, due to these microstructural changes was validated using the Hall-Petch relationship and Taylor hardening law. This study confirms the relationship between twinning behavior and microstructural changes in CP-Ti at CT, as well as their impact on fatigue properties.

Keywords: cryogenic deformation, low cycle fatigue, microstructure, twinning, detwinning.

Suggested Citation

An, Ji Seob and Jo, Min Ji and Jo, A. Ra and Jeong, Myeong Sik and Kim, Dong-Kyu and Moon, Young Hoon and Hwang, Sun Kwang, Microstructure Evolution and Fatigue Properties of Cp-Ti Induced by Cryogenic Low Cycle Fatigue. Available at SSRN: https://ssrn.com/abstract=4964968 or http://dx.doi.org/10.2139/ssrn.4964968

Ji Seob An

affiliation not provided to SSRN ( email )

No Address Available

Min Ji Jo

affiliation not provided to SSRN ( email )

No Address Available

A. Ra Jo

affiliation not provided to SSRN ( email )

No Address Available

Myeong Sik Jeong

affiliation not provided to SSRN ( email )

No Address Available

Dong-Kyu Kim

Konkuk University ( email )

Seoul 143-701, Korea
120 Neungdong-ro, Gwangjin-gu
Seoul 143-701, 143-701
Korea, Republic of (South Korea)

Young Hoon Moon

Pusan National University ( email )

Sun Kwang Hwang (Contact Author)

affiliation not provided to SSRN ( email )

No Address Available

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