Nondestructive Testing Of Defects at One Pixel Level with Move Contrast X-Ray Imaging

Abstract

X-ray imaging is broadly applied for the defect detections in industry and research fields. However, traditional X-ray imaging methods often struggle to achieve high sensitivity in nondestructive testing when defect sizes are at one pixel level, signal absorption is weak, and the background is complex. To address these challenges, we proposes and develops a move-contrast nondestructive-testing (MCNDT) method to achieve the non-destructive testing of defects at one-pixel-level based on move contrast X-ray imaging (MCXI).MCXI leverages the relative motion characteristics of target objects to suppress noise and enhance the sensitivity of weak signal detection in complex backgrounds. This technique has been successfully applied in fields such as biomedical imaging and high-resolution material studies, demonstrating significant noise resistance and sensitivity improvements. This paper extends MCXI to the testing of defects in static samples, aiming to solve the challenges of testing one-pixel-level defects in high-noise and complex backgrounds. Through numerical simulations and experimental validation, we demonstrate that MCNDT can achieve high-sensitivity testing of one-pixel-level defects, significantly improving the Contrast-to-Noise Ratio (CNR) and providing an innovative solution for nondestructive testing in complex materials and structures.

Keywords: nondestructive testing, defect testing at one pixel level, move contrast X-ray imaging, weak signal imaging in a complex system