In-Situ Analysis of Image Noise in Cspbi 2 Br Perovskite X-Ray Detectors

Abstract

The perovskite X-ray flat panel detector, characterized by its high sensitivity and low dose requirements, is considered a promising candidate for the next generation of X-ray detectors. However, achieving adequate image resolution remains a considerable challenge. In this paper, we employ a spraying process to fabricate a direct X-ray detector with a high-resolution pixel size of 100×100 μm². The detector demonstrates excellent performance characterized by low a detection limit of 50 nGyair s-1 and high sensitivity (2222 μC Gyair-1 cm−2). By employing background image subtraction and Gaussian noise reduction techniques, a clear image is obtained. The photocurrent characteristics of the pixel-level CsPbI2Br perovskite device are investigated using in-situ detection techniques. By integrating TFT circuit analysis and electrical simulations, it is concluded that the primary source of image noise originates from fluctuations in photocurrent at the pixel level.

Keywords: perovskite, X-ray Detectors, High-Resolution, Low Dose Rate；Image Noise