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A Robust Metal Oxide Thin Film with Saturation Magnetization Exceeding 2 Tesla

31 Pages Posted: 15 Apr 2020 Publication Status: Published

See all articles by Kai Trepka

Kai Trepka

Harvard University - The Rowland Institute at Harvard

Roland Hauert

Swiss Federal Laboratories for Material Science and Technology (EMPA)

Claudia Cancellieri

Swiss Federal Laboratories for Material Science and Technology (EMPA)

Ye Tao

Harvard University - The Rowland Institute at Harvard

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Abstract

High saturation magnetization, hysteresis-less long linear response range, and resistance to devicefabrication conditions are figures of merit for magnetic materials in science and technology.Despite advances in materials research, many high-saturating micro- and nanomagnetic materialsare hysteresis-prone, have short linear ranges, and are sensitive to oxidation, resulting in deviceinefficiencies in high-frequency electronics and unpredictable responses in magnetic sensing applications.Holmium oxide is a promising material because of its high magnetic susceptibility,but synthetic options are limited, with low-temperature magnetism incompletely characterized.Here, we present physical vapor deposition synthesis and material characterization of polycrystallineholmium oxide thin films. The product has saturation magnetization exceeding 2 Tesla,linear range (μ0H) also exceeding 2 Tesla, zero magnetic remanence and coercivity, and resistanceto harsh processing conditions including oxygen plasma and concentrated hydrofluoricacid etching, making these thin films ideal for fabricating next-generation nanoscale magneticdevices in advanced scientific and engineering applications.

Keywords: magnetic thin film, 2 Tesla saturation magnetization, chemically robust, holmium oxide, hysteresis-free, quantitative magnetic metrology

Suggested Citation

Trepka, Kai and Hauert, Roland and Cancellieri, Claudia and Tao, Ye, A Robust Metal Oxide Thin Film with Saturation Magnetization Exceeding 2 Tesla. Available at SSRN: https://ssrn.com/abstract=3565042 or http://dx.doi.org/10.2139/ssrn.3565042
This version of the paper has not been formally peer reviewed.

Kai Trepka

Harvard University - The Rowland Institute at Harvard ( email )

100 Edwin H. Land Blvd
Cambridge, MA
United States

Roland Hauert

Swiss Federal Laboratories for Material Science and Technology (EMPA) ( email )

Überlandstrasse 129
Dübendorf, 8600
Switzerland

Claudia Cancellieri

Swiss Federal Laboratories for Material Science and Technology (EMPA) ( email )

Dübendorf, 8600
Switzerland

Ye Tao (Contact Author)

Harvard University - The Rowland Institute at Harvard ( email )

100 Edwin H. Land Blvd
Cambridge, MA
United States

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