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Antonio Cantudo

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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Scholarly Papers (1)

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Thickness-dependent resistive switching in engineered TiN/Ti/HfO2/W memristors

Number of pages: 15 Posted: 21 Jan 2026
Antonio Lopez, Mireia B. Gonzalez, Antonio Cantudo, Mercedes Saludes-Tapia, P. Ríos, Francisco Jimenez-Molinos, Juan B. Roldán and Marco Antonio Villena
affiliation not provided to SSRN, Microelectronics Institute of Barcelona, affiliation not provided to SSRN, Microelectronics Institute of Barcelona, affiliation not provided to SSRN, affiliation not provided to SSRN, University of Granada and affiliation not provided to SSRN
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Abstract:

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Memristors, resistive memory, kinetic Monte Carlo simulation, titanium electrode, dielectric engineering