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Campbell Bouch

affiliation not provided to SSRN

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Synchrotron X-ray topography analysis of the distribution and formation mechanisms of low angle grain boundaries in PVT-Grown 4H-SiC Crystal

Number of pages: 9 Posted: 14 Feb 2026
Jianpei Zhang, Zeyu Chen, Yuzhuo LI, SHANSHAN HU, Balaji Raghothamachar, Yafei Liu, Campbell Bouch, Ryan Philpott, Scott Turchetti, Pete Schunemann and Michael Dudley
State University of New York (SUNY), Stony Brook, State University of New York (SUNY), Stony Brook, State University of New York (SUNY), Stony Brook, State University of New York (SUNY), Stony Brook, State University of New York (SUNY), Stony Brook - Department of Materials Science and Chemical Engineering, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and State University of New York (SUNY), Stony Brook
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4H-SiC, Low-angle grain boundary, Synchrotron x-ray topography