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Swanand Telpande

affiliation not provided to SSRN

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Scholarly Papers (1)

1.

Electromagnetically-Induced Fracture: Microstructural Evidence of Pulse-Synchronized Crack Growth in Thin Conductors

Number of pages: 16 Posted: 30 Apr 2026
Swanand Telpande and Praveen Kumar
affiliation not provided to SSRN and Indian Institute of Science (IISc) - Indian Institute of Science, Bangalore
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Abstract:

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Electromagnetic loading, fracture mechanics, Fractography, Incremental crack growth, Thin metallic foils