default author photo

Sameer Pokhrel

Jeonbuk National University

Korea, Republic of (South Korea)

  • Jeonbuk National University

SCHOLARLY PAPERS

1

DOWNLOADS

20

TOTAL CITATIONS

0

Scholarly Papers (1)

Actions:
Email selected abstracts
1.

Annealing-temperature-dependent defect evolution and carrier transport in Si-implanted single-crystal AlN

Number of pages: 23 Posted: 23 May 2026
Sameer Pokhrel, Sung-Won Lee, Hyung Joong Yun, Jonghan Won and Chel-Jong Choi
Jeonbuk National University, Jeonbuk National University, Korea Basic Science Institute (KBSI), Korea Basic Science Institute (KBSI) and Jeonbuk National University - Semiconductor Physics Research Center
Downloads 20 (1,459,862)

Abstract:

Loading...

AlN, Si implantation, nitrogen defect, out-diffusion, Schottky contact, carrier transport