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Dominiek Reynaerts

KU Leuven

Oude Markt 13

Leuven, Vlaams-Brabant 3000

Belgium

SCHOLARLY PAPERS

5

DOWNLOADS

539

TOTAL CITATIONS

2

Scholarly Papers (5)

1.

In-Process Virtual Quality Monitoring

Proceedings of the Machining Innovations Conference (MIC) 2020
Number of pages: 7 Posted: 13 Nov 2020
Shashwat Kushwaha, Benjamin Gorissen, Jun Qian and Dominiek Reynaerts
KU Leuven, KU Leuven, KU Leuven and KU Leuven
Downloads 220 (353,017)
Citation 2

Abstract:

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Process monitoring; Virtual metrology; Virtual quality control; Edge computing; Process parallel quality estimation; Digital shadow; Digital twin; Closed-loop manufacturing

2.

Fast Part Geometry Estimation for 3-axis Milling

Machining Innovations Conference for Aerospace Industry (MIC) 2025
Number of pages: 8 Posted: 21 Feb 2025
Yiğit Özcan, Shashwat Kushwaha, Jun Qian and Dominiek Reynaerts
KU Leuven, KU Leuven, KU Leuven and KU Leuven
Downloads 114 (621,896)

Abstract:

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Material removal simulation, dexelization, tri-dexel, milling, cutter workpiece engagement, digital shadow

3.

Uncertainty Evaluation of an On-Machine Chromatic Confocal Measurement System

Number of pages: 24 Posted: 22 Jan 2023
Long Ye, Jun Qian, Han Haitjema and Dominiek Reynaerts
KU Leuven, KU Leuven, KU Leuven and KU Leuven
Downloads 106 (659,652)

Abstract:

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On-machine measurement, calibration, measurement uncertainty, chromatic confocal, Micro-EDM

4.

Closed-Loop Control of Μedm Surface Quality with Alternate On-Machine Metrology and In-Process Virtual Metrology

Number of pages: 22 Posted: 06 Dec 2023
KU Leuven, KU Leuven, Northwestern University, KU Leuven and KU Leuven
Downloads 51 (1,063,489)

Abstract:

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Micro-EDM, Process monitoring, Closed-loop control, Quality control, On-machine measurement, Online machine learning

5.

A Physics-Informed Cnn-Tse Hybrid Network for Micro-Edm Process Monitoring and Control

Number of pages: 26 Posted: 28 Apr 2023
Long Ye, Jun Qian and Dominiek Reynaerts
KU Leuven, KU Leuven and KU Leuven
Downloads 48 (1,097,529)

Abstract:

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processing monitoring, process control, signal processing, deep learning, self-attention network, EDM