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Krishna Kumar Saxena

KU Leuven

Oude Markt 13

Leuven, 3000

Belgium

SCHOLARLY PAPERS

1

DOWNLOADS

51

TOTAL CITATIONS

0

Scholarly Papers (1)

1.

Closed-Loop Control of Μedm Surface Quality with Alternate On-Machine Metrology and In-Process Virtual Metrology

Number of pages: 22 Posted: 06 Dec 2023
Long Ye, Krishna Kumar Saxena, Kornel Ehmann, Jun Qian and Dominiek Reynaerts
KU Leuven, KU Leuven, Northwestern University, KU Leuven and KU Leuven
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Abstract:

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Micro-EDM, Process monitoring, Closed-loop control, Quality control, On-machine measurement, Online machine learning