Gaithersburg, MD 20899-8910
United States
Government of the United States of America - National Institute of Standards and Technology (NIST)
glass, elemental analysis, micro-XRF, LIBS, laser ablation
Aluminosilicate glass, µ-XRF, Spectral contrast angle (SCA) ratios, Portable electronic devices, Liquid glass
glass, interlaboratory study, XRF, silicon drift detector (SDD)
novel psychoactive substances (NPS), DART-MS, is-CID mass spectral classifications, seized drugs
Chemical attribution signatures, Polymers, Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS), Likelihood ratio, Elemental profiling