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Jorien Schoorl

Netherlands Forensic Institute

Netherlands

  • Netherlands Forensic Institute

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Evaluating the Strength of Evidence of Elemental Profiling of Polymers with La-Icp-Ms

Number of pages: 24 Posted: 05 Mar 2024
Mirjam de Bruin-Hoegée, Ruthmara Corzo, Peter Zoon, Peter Vergeer, Jorien Schoorl, Marcel J. van der Schans, Daan Noort and Arian C. van Asten
University of Amsterdam, Government of the United States of America - National Institute of Standards and Technology (NIST), Netherlands Forensic Institute, Netherlands Forensic Institute, Netherlands Forensic Institute, affiliation not provided to SSRN, affiliation not provided to SSRN and University of Amsterdam
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Abstract:

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Chemical attribution signatures, Polymers, Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS), Likelihood ratio, Elemental profiling