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Tomáš Šikola

affiliation not provided to SSRN

  • affiliation not provided to SSRN

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A Tag-and-Count Approach for Quantifying Surface Silanol Densities on Fused Silica Based on Atomic Layer Deposition and High-Sensitivity Low-Energy Ion Scattering

Number of pages: 38 Posted: 16 Feb 2022
Matthew Linford, Tahereh G. Avval, Stanislav Průša, Cody V. Cushman, Grant T. Hodges, Sarah Fearn, Jan Čechal, Tomáš Šikola and Hidde H. Brongersma
Brigham Young University, Brigham Young University, Masaryk University - Central European Institute of Technology, Corning Incorporated, affiliation not provided to SSRN, Imperial College London, Brno University of Technology, affiliation not provided to SSRN and Eindhoven University of Technology (TUE)
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Tag-and-count, Atomic Layer Deposition, low energy ion scattering, fused silica, ZnO