affiliation not provided to SSRN
Ellipsometry, X-ray reflectivity, X-ray diffraction, Thermochromic, Refractive index, Extinction coefficient, Dielectric constants, Energy gap Plasma frequency, Optical conductivity
pseudocapacitors, adsorption, Doping, co-doping, Activated carbon
Pseudocapacitors, Adsorption, doping, Co-doping, Activated carbon
Thin film deposition and growth, Molecular dynamics method, Silicon nitride, Mechanical Properties
Chemical Vapour Deposition, Intrinsic Mechanical Stress, Thermal Mismatch, Thick Silicon Nitride