affiliation not provided to SSRN
SrTi0.5Fe0.5O3−𝛿, X-ray Reciprocal Space Mapping, X-ray Reflectivity, Strain, Strain relaxation
SrTi0.5Fe0.5O3−𝛿, X-ray Reciprocal Space Mapping, X-rayReflectivity, Strain, Strain relaxation
VO2 thin films, Metal-insulator transition, Structural phase transition, Reciprocal space map, Correlation length
(InxGa1-x)2O3 thin films, Spontaneous phase separation, Short-range positional order, Binodal decomposition, Periodic concentration profiling of In atoms